X-ray and CT Inspection for industrial and electronic applications. Nikon Metrology manufactures X-ray and Computed Tomography (CT) inspection systems that get the inside picture of complex industrial parts, by looking into the internal structure. The CT capability is used to qualify and quantify any inner or outer dimension in a smooth, non-destructive process. X-ray electronics inspection systems respond to a growing demand for flexible, detailed and affordable inspection to cope with the demands of ever-smaller electrical components and comply with tighter quality standards.

XT H 225 for all-purpose X-ray and CT inspection

The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.

Key benefits:

  •        Proprietary 225kV microfocus X-ray source with 3µm focal spot size
  •        Easy system operation and low cost-of-ownership
  •        Stunning images providing great insight
  •        High performance image acquisition and volume processing
  •        Straightforward inspection automation
  •        Safety fir

XT H 160/225 specs

Microfocus source        Max. kV Max. power Focal spot size Focal spot size
at max power
160 kV Xi, Reflection target 160 kV 60 W 3 µm up to 7 W 60 µm at 60 W
160 kV Reflection target 160 kV 225 W 3 µm up to 7 W 225 µm at 225 W
180kV Transmission target 180 kV 10 W 1 µm up to 3 W 10 µm at 10 W
225 kV Reflection target 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W
225 kV Rotating target option 225 kV 450 W 10 µm up to 30 W 113 µm at 450 W
# Bits Active pixels Pixel Size Max. frame rate at 1×1 binning Max. frame rate at 2×2 binning
14-bit 1000 x 1000 127 µm 10 fps 30 fps
14-bit 1900 x 1516 127 µm 7.5 fps 15 fps
14-bit 2300 x 3200 127 µm 3 fps  7 fps
14-bit 1000 x 1000 200 µm 7.5 fps  15 fps
XT H 225 ST Industrial CT inspection

The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.

Key benefits:

  •        Proprietary 225kV microfocus X-ray source with 3µm focal spot size
  •        Easy system operation
  •        Stunning images providing maximum insight
  •        High performance image acquisition and volume processing
  •        Straightforward inspection automation
  •        Safety by design
  •        Low cost-of-ownership

XT H 225 ST specs

Microfocus source           Max. kV Max. power Focal spot size Focal spot size
at max power
180kV Transmission target 180 kV 10 W 1 µm up to 3 W 10 µm at 10 W
225 kV Reflection target 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W
225 kV Rotating target option 225 kV 450 W 10 µm up to 30 W 113 µm at 450 W
Detectors                   # Bits Active pixels Pixel Size Max. frame rate
at 1×1 binning
Max. frame rate
at 2×2 binning
Varian 2520 14-bit 1900 x 1516 127 µm 7.5 fps  15 fps
Varian 4030 14-bit 2300 x 3200 127 µm 3 fps  7 fps
Perkin Elmer 0820 16-bit 1000 x 1000 200 µm 7.5 fps  15 fps
Perkin Elmer 1620 16-bit 2000 x 2000 200 µm 3.75 fps 7.5 fps
Perking Elmer 1621 EHS 16-bit 2000 x 2000 200 µm 15 fps 30 fps
XT H 320 for X-ray and CT inspection of larger sample

The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span

Key benefits

  •        Proprietary 320kV microfocus X-ray source
  •        Run highly accurate inspection on dense industrial objects
  •        Easy system operation and low cost-of-ownership
  •        Stunning images providing great insight
  •        High performance image acquisition and volume processing
  •        Straightforward inspection automation
  •        Safety first
Microfocus source       Max. kV Max. power Focal spot size Focal spot size  at max power XT H 320
225 kV Reflection target 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W
225 kV Rotating target option 225 kV 450 W 10 µm up to 30 W 113 µm at 450 W
320 kV Reflection target 320 kV 320 W 30 µm up to 30 W 300 µm at 320 W
Detectors             # Bits Active pixels Pixel Size Max. frame rate at 1×1 binning Max. frame rate at 2×2 binning
Varian 2520 (1) 14-bit 1900 x 1516 127 µm 7.5 fps  15 fps
Perkin Elmer 0820 14-bit 1000 x 1000 200 µm 7.5 fps  15 fps
Perkin Elmer 1620 16-bit 2000 x 2000 200 µm 3.75 fps  7.5 fps
Perkin Elmer 1621 EHS 16-bit 2000 x 2000 200 µm 15 fps 30 fps
Combination
PE162x & CLDA
Configuration with both Flat panel and
Curved Linear Diode Array detector
Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection

The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy. The system is available with a flat panel or a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

This linear detector realizes stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. 450kV and the CLA are ideal for the inspection of small to medium metal alloy turbine blades and casted parts.

Key benefits:

  •        Proprietary 450kV microfocus X-ray source
  •        Run highly accurate inspection on dense turbine blades
  •        Easy system operation and low cost-of-ownership
  •        Stunning 3D images without scattering provide critical insights
  •        High performance image acquisition and volume processing
  •        Straightforward inspection automation
Microfocus source           Max. kV Max. power Focal spot size Focal spot size  at max power
450 kV Reflection target 450 kV 450 W 80 µm up to 200 W 320 µm  at 450 W
450 kV High brilliance source 450 kV 450 W 80 µm up to 200 W 113 µm at 450 W
Detectors                   # Bits Active pixels Pixel Size Max. frame rate  at 1×1 binning Max. frame rate  at 2×2 binning
Perkin Elmer 1620 16-bit 2000 x 2000 200 µm 3.75 fps  7.5 fps
Perkin Elmer 1621 EHS 16-bit 2000 x 2000 200 µm 15 fps  30 fps
Nikon Metrology CLDA 16-bit 2000 415 µm 50 fps  50 fps
Combination PE162x & CLDA  Configuration with both Flat panel and Curved Linear Diode Array detector