Configurable X-ray CT systems

Configurable X-ray CT systems

CT - versatility - Limitless configurations for precision CT scanning

Nikon Metrology’s configurable X-ray/CT systems offer a large inspection envelope, support multiple sources, multiple detectors and can be custom-configured to fit a variety of applications. Nikon Metrology’s modular micro focus CT systems can be built into existing cabinets or walk-in rooms to upgrade older film-based facilities or mini-focus systems.

The core of these configurable systems are the Nikon in-house-built micro focus sources up to 450 kV. The focal spot size of these micro focus sources is orders-of-magnitude smaller when compared to mini focus sources, which results in superior resolution and accuracy.

C2 Extra large-envelope X-ray/CT inspection system

The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.

Supporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.

Features

  • Patented ultra precise and stable manipulator
  • Extra large inspection envelope
  • Install into existing radiation enclosure or supplied with new modular radiation enclosure
  • Patented microfocus X-ray tube technology, available in 225 kV, 320 kV and 450 kV
  • Supports dual x-ray tubes
  • Supports dual detectors
  • Large format 16-bit detector technology
  • Exclusive Curved Linear Diode Array technology
  • Intuitive software interface
  • Advanced 3D visualization and analysis
  • Customizable macros to automate work flow

Applications

  • Aerospace structures
  • Evaluation of precision parts and large castings, complex mechanisms and internal components
  • Part-to-CAD comparison
  • Reverse engineering
  • Detailed failure analysis
  • Advanced material research and analysis of biological structures
  • Digital archiving of models

M2 high-precision X-ray/ CT inspection system

The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator.

Supporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Diode Array (CLDA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The M2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.

Features

  • Patented ultra-precise and stable manipulator
  • Exclusive x-axis bridge design
  • Large inspection envelope
  • Install into existing radiation enclosure or supplied with new modular radiation enclosure
  • Patented X-ray tube technology. 225 kV, 320 kV, 450 kV available
  • Supports dual x-ray tubes
  • Supports dual detectors
  • Large format 16-bit detector technology
  • Exclusive Curved Linear Diode Array technology
  • Intuitive software interface
  • Advanced 3D visualization and analysis
  • Customizable macros to automate work flow

Applications

  • Turbine blade inspection
  • Evaluation of precision parts and large castings, complex mechanisms and internal components
  • Part-to-CAD comparison
  • Reverse engineering
  • Detailed failure analysis

M1 Configurable X-ray/ CT inspection system

The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of sample setup.

Supporting sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with flat-panel detector technology and Nikon micro focus sources.

Features

  • Large inspection envelope
  • Install into existing radiation enclosure or supplied with new modular radiation enclosure
  • Patented X-ray tube technology. 225 kV, 320 kV and 450 kV available
  • Large format 16-bit detector technology and image processing tools
  • Intuitive software interface
  • Advanced 3D visualization and analysis
  • Customizable macros to automate work flow

Applications

  • Evaluation of precision parts and large castings, complex mechanisms and internal components
  • Part-to-CAD comparison
  • Reverse engineering
  • Detailed failure analysis
  • Advanced material research and analysis of biological structures
  • Digital archiving of models
  • Troubleshooting of assembly issues

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